Assisting with ongoing efforts to integrate in-line defect metrology into our process flows Supporting operations in addressing lot holds across the fleet of Characterization Engineering tool sets Supporting statistical process control (SPC), continuous improvement efforts, and the management and dissemination of metrology and defect metrology data Bachelor's degree in Electrical Engineering, Chemical Engineering, Materials Engineering and Mechanical Engineering, Chemistry, Physics or other related technical discipline with 0 year of relevant experience. Ability to work 3rd shift hours (11PM-8AM Mon-Fri); Option of 5x8 or 9/80B schedule Hands on experience with Si, GaAs, or other wafers Ability to work in a cleanroom setting U.S. Citizenship required. The ability to obtain and maintain a DoD Secret clearance is required. Bachelor's degree in Electrical Engineering, Chemical Engineering, Materials Engineering and Mechanical Engineering, Chemistry, Physics or other related technical discipline with 2 years of relevant experience General understanding of defect inspection and review tools (such as dark field, bright field, and scanning electron microscopes) General understanding of metrology (such as CD SEMs. litho overlay tools, surface topology profilers, thin film thickness measurement tools) or analytical tools Ability to work 3rd shift hours (11PM-8AM Mon-Fri); Option of 5x8 or 9/80B schedule Basic knowledge of statistical process control Hands on experience with Si, GaAs, or other wafers Ability to work in a cleanroom setting Hands on knowledge and operation of defect inspection and review tools (such as dark field, bright field, and scanning electron microscopes) Hands on knowledge and operation of metrology (such as CD SEMs, litho overlay tools, surface topology profilers, thin film thickness measurement tools) or analytical tools Experience in lean manufacturing practices and structured problem-solving methodology Experience working in a cleanroom setting 1 year experience with semiconductor fabrication Data analysis and visualization (JMP) Experience developing technical specifications for equipment procurement Active Secret clearance