Assisting with ongoing efforts to integrate in-line defect metrology into our process flows. Supporting statistical process control (SPC), continuous improvement efforts, and the management and dissemination of metrology data. Bachelors degree in Electrical Engineering, Chemical Engineering, Materials Engineering and Mechanical Engineering, Chemistry, Physics or other related technical discipline with 5 years of relevant experience; Master's degree in Electrical Engineering, Chemical Engineering, Materials Engineering and Mechanical Engineering, Chemistry, Physics or other related technical discipline with 3 years of relevant experience; PhD. in Electrical Engineering, Chemical Engineering, Materials Engineering and Mechanical Engineering, Chemistry, Physics or other related technical discipline with 1 year of relevant experience. General understanding of defect inspection and review tools (such as dark field, bright field, and scanning electron microscopes) Basic knowledge of statistical process control Knowledge of recipe creation and optimization Hands on experience with Si, GaAs, or other wafers Experience with semiconductor fabrication Ability to work in a cleanroom setting US citizenship is required The ability to obtain and maintain a DoD Secret clearance is required Hands on knowledge and operation of defect inspection and review tools (such as dark field, bright field, and scanning electron microscopes) Knowledge of defect inspection process Experience in lean manufacturing practices and structured problem-solving methodology Experience working in a cleanroom setting Data analysis and visualization (JMP) Ability to create and validate quality recipes for defect processes Experience utilizing KLA, Applied Materials (AMAT) equipment Experience with coordinating with vendors Experience developing technical specifications for equipment procurement Ability to develop and maintain documentation on processes Active Secret clearance with ability to obtain Top Secret Clearance